مؤتمر
New qualified industrial AlGaN/GaN HEMT process: Power performances & reliability figures of merit
| العنوان: | New qualified industrial AlGaN/GaN HEMT process: Power performances & reliability figures of merit |
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| المؤلفون: | Floriot, D., Blanck, H., Bouw, D., Bourgeois, F., Camiade, M., Favede, L., Hosch, M., Jung, H., Lambert, B., Nguyen, A., Riepe, K., Splettstosse, J., Stieglauer, H., Thorpe, J., Meiners, U. |
| المصدر: | 2012 7th European Microwave Integrated Circuit Conference Microwave Integrated Circuits Conference (EuMIC), 2012 7th European. :317-320 Oct, 2012 |
| Relation: | 2012 European Microwave Integrated Circuit Conference (EuMIC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9782874870262 9781467323024 9782874870286 |
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