مؤتمر
Fluorine improvement of MOSFET interface as revealed by RTS measurements and HRTEM
| العنوان: | Fluorine improvement of MOSFET interface as revealed by RTS measurements and HRTEM |
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| المؤلفون: | Kim, Joo Hyung, Kim, Jung Joo, Lee, Chang Eun, Lee, Jong Ho, Kim, Dong Seok, Kim, Nam Joo, Yoo, Kwang Dong, Park, Heung Soo |
| المصدر: | 2013 IEEE Radio and Wireless Symposium Radio and Wireless Symposium (RWS), 2013 IEEE. :97-99 Jan, 2013 |
| Relation: | 2013 IEEE Radio and Wireless Symposium (RWS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467329316 9781467329293 9781467329309 9781467329323 |
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| تدمد: | 21642958 21642974 |
| DOI: | 10.1109/RWS.2013.6486653 |