دورية أكاديمية
Trapping and Reliability Assessment in D-Mode GaN-Based MIS-HEMTs for Power Applications
| العنوان: | Trapping and Reliability Assessment in D-Mode GaN-Based MIS-HEMTs for Power Applications |
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| المؤلفون: | Meneghini, M., Bisi, D., Marcon, D., Stoffels, S., Van Hove, M., Wu, T.-L., Decoutere, S., Meneghesso, G., Zanoni, E. |
| المصدر: | IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 29(5):2199-2207 May, 2014 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 08858993 19410107 |
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| DOI: | 10.1109/TPEL.2013.2271977 |