Using yield models to accelerate learning curve progress

التفاصيل البيبلوغرافية
العنوان: Using yield models to accelerate learning curve progress
المؤلفون: Dance, D., Jarvis, R.
المصدر: IEEE/SEMI International Symposium on Semiconductor Manufacturing Science Semiconductor Manufacturing Science Symposium, 1990. ISMSS 1990., IEEE/SEMI International. :63-67 1990
Relation: 1990 IEEE/SEMI International Symposium on Semiconductor Manufacturing Science
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
DOI:10.1109/ISMSS.1990.66108