دورية أكاديمية
Exposing Reliability/Performance Tradeoff in Non-Volatile Memories Through Erratic Bits Signature Classification
| العنوان: | Exposing Reliability/Performance Tradeoff in Non-Volatile Memories Through Erratic Bits Signature Classification |
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| المؤلفون: | Zambelli, C., Koebernik, G., Ullmann, R., Bauer, M., Tempel, G., Di Tano, F., Atti, M., Pistone, F. P., Siviero, A., Olivo, P. |
| المصدر: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 14(1):66-73 Mar, 2014 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15304388 15582574 |
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| DOI: | 10.1109/TDMR.2013.2284639 |