التفاصيل البيبلوغرافية
العنوان: |
Radiation response of Al2O3-based MOS capacitors under different bias conditions |
المؤلفون: |
Salomone, L. Sambuco, Kasulin, A., Lipovetzky, J., Carbonetto, S. H., Inza, M. A. Garcia, Redin, E. G., Berbeglia, F., Campabadal, F., Faigon, A. |
المصدر: |
2013 7th Argentine School of Micro-Nanoelectronics, Technology and Applications Micro-Nanoelectronics, Technology and Applications (EAMTA), 2013 7th Argentine School of. :22-26 Aug, 2013 |
Relation: |
2013 7th Argentine School of Micro-Nanoelectronics, Technology and Applications (EAMTA) |
قاعدة البيانات: |
IEEE Xplore Digital Library |