Radiation response of Al2O3-based MOS capacitors under different bias conditions

التفاصيل البيبلوغرافية
العنوان: Radiation response of Al2O3-based MOS capacitors under different bias conditions
المؤلفون: Salomone, L. Sambuco, Kasulin, A., Lipovetzky, J., Carbonetto, S. H., Inza, M. A. Garcia, Redin, E. G., Berbeglia, F., Campabadal, F., Faigon, A.
المصدر: 2013 7th Argentine School of Micro-Nanoelectronics, Technology and Applications Micro-Nanoelectronics, Technology and Applications (EAMTA), 2013 7th Argentine School of. :22-26 Aug, 2013
Relation: 2013 7th Argentine School of Micro-Nanoelectronics, Technology and Applications (EAMTA)
قاعدة البيانات: IEEE Xplore Digital Library