Maximizing ESD robustness of current-mode-logic (CML) driver with internal gate bias network

التفاصيل البيبلوغرافية
العنوان:	Maximizing ESD robustness of current-mode-logic (CML) driver with internal gate bias network
المؤلفون:	Li, You, Di Sarro, James, Chang, Shunhua, Li, Junjun, Gauthier, Robert, Halbach, Ralph
المصدر:	2013 35th Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th. :1-8 Sep, 2013
Relation:	2013 35th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
قاعدة البيانات:	IEEE Xplore Digital Library

الوصف
ردمك:	9781585372324
تدمد:	07395159