مؤتمر
Totally self-checking (TSC) VLSI circuits using Scalable Error Detection Coding (SEDC) technique
| العنوان: | Totally self-checking (TSC) VLSI circuits using Scalable Error Detection Coding (SEDC) technique |
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| المؤلفون: | Somasundaram, Natarajan, Mehdipour, Farhad, Lee, Jeong-A, Ramadass, N, Rao, Y V Ramana |
| المصدر: | Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) Quality Electronic Design (ASQED), 2013 5th Asia Symposium on. :72-79 Aug, 2013 |
| Relation: | 2013 5th Asia Symposium on Quality Electronic Design (ASQED) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479913121 9781479913145 |
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| DOI: | 10.1109/ASQED.2013.6643567 |