مؤتمر
0.25 /spl mu/m integrated circuit yield model design and validation
| العنوان: | 0.25 /spl mu/m integrated circuit yield model design and validation |
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| المؤلفون: | Lakhani, F., Dance, D., Williams, R. |
| المصدر: | 1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat. No.97CH36023) Semiconductor manufacturing Semiconductor Manufacturing Conference Proceedings, 1997 IEEE International Symposium on. :E21-E24 1997 |
| Relation: | 1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780337522 9780780337527 |
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| DOI: | 10.1109/ISSM.1997.664557 |