Thermal Neutron-Induced Soft Errors in Advanced Memory and Logic Devices

التفاصيل البيبلوغرافية
العنوان:	Thermal Neutron-Induced Soft Errors in Advanced Memory and Logic Devices
المؤلفون:	Fang, Y.-P., Oates, A. S.
المصدر:	IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 14(1):583-586 Mar, 2014
قاعدة البيانات:	IEEE Xplore Digital Library

الوصف
تدمد:	15304388 15582574
DOI:	10.1109/TDMR.2013.2287699