مؤتمر
Adaptive testing - Cost reduction through test pattern sampling
| العنوان: | Adaptive testing - Cost reduction through test pattern sampling |
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| المؤلفون: | Grady, Matt, Pepper, Bradley, Patch, Joshua, Degregorio, Michael, Nigh, Phil |
| المصدر: | 2013 IEEE International Test Conference (ITC) Test Conference (ITC), 2013 IEEE International. :1-8 Sep, 2013 |
| Relation: | 2013 IEEE International Test Conference (ITC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479908592 |
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| تدمد: | 10893539 23782250 |
| DOI: | 10.1109/TEST.2013.6651891 |