دورية أكاديمية
Improvement in the Photo-Bias Stability of Zinc Tin Oxide Thin-Film Transistors by Introducing a Thermal Oxidized ${\rm TiO}_{2}$ Film as a Hole Carrier Blocking Layer
| العنوان: | Improvement in the Photo-Bias Stability of Zinc Tin Oxide Thin-Film Transistors by Introducing a Thermal Oxidized ${\rm TiO}_{2}$ Film as a Hole Carrier Blocking Layer |
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| المؤلفون: | Lee, C.-K., Hwang, A. Y., Yang, H., Kim, D.-H., Bae, J.-U., Shin, W.-S., Jeong, J. K. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 60(12):4165-4172 Dec, 2013 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2013.2286819 |