مؤتمر
Wafer-Level Transmission Line Pulse Testing for Optimization of Output Transistor ESD Resistance
العنوان: | Wafer-Level Transmission Line Pulse Testing for Optimization of Output Transistor ESD Resistance |
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المؤلفون: | Miller, J.W., Dickson, N., Rushing, T. |
المصدر: | International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 1993 International. :208-214 1993 |
Relation: | International Integrated Reliability Workshop Final Report |
قاعدة البيانات: | IEEE Xplore Digital Library |
DOI: | 10.1109/IRWS.1993.666316 |
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