دورية أكاديمية
Security Analysis of Industrial Test Compression Schemes
| العنوان: | Security Analysis of Industrial Test Compression Schemes |
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| المؤلفون: | Das, A., Ege, B., Ghosh, S., Batina, L., Verbauwhede, I. |
| المصدر: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 32(12):1966-1977 Dec, 2013 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 02780070 19374151 |
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| DOI: | 10.1109/TCAD.2013.2274619 |