دورية أكاديمية
The test of time. Clock-cycle estimation and test challenges for future microprocessors
| العنوان: | The test of time. Clock-cycle estimation and test challenges for future microprocessors |
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| المؤلفون: | Fisher, P.D., Nesbitt, R. |
| المصدر: | IEEE Circuits and Devices Magazine IEEE Circuits Devices Mag. Circuits and Devices Magazine, IEEE. 14(2):37-44 Mar, 1998 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 87553996 15581888 |
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| DOI: | 10.1109/101.666590 |