Normally-off AlGaN/GaN MOS-HEMTs by KOH wet etch and rf-sputtered HfO2 gate insulator

التفاصيل البيبلوغرافية
العنوان: Normally-off AlGaN/GaN MOS-HEMTs by KOH wet etch and rf-sputtered HfO2 gate insulator
المؤلفون: Ahn, Woojin, Seok, Ogyun, Ha, Min-Woo, Kim, Young-Shil, Han, Min-Koo
المصدر: 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on. :311-314 May, 2013
Relation: 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781467351348
9781467351355
9781467351362
تدمد:10636854
19460201
DOI:10.1109/ISPSD.2013.6694411