Modeling of trap induced dispersion of large signal dynamic Characteristics of GaN HEMTs

التفاصيل البيبلوغرافية
العنوان: Modeling of trap induced dispersion of large signal dynamic Characteristics of GaN HEMTs
المؤلفون: Jardel, O., Laurent, S., Reveyrand, T., Quere, R., Nakkala, P., Martin, A., Piotrowicz, S., Campovecchio, M., Delage, S.L.
المصدر: 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International. :1-4 Jun, 2013
Relation: 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781467361774
9781467361767
تدمد:0149645X
DOI:10.1109/MWSYM.2013.6697576