دورية أكاديمية
A Detailed Study of Gate Insulator Process Dependence of NBTI Using a Compact Model
| العنوان: | A Detailed Study of Gate Insulator Process Dependence of NBTI Using a Compact Model |
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| المؤلفون: | Joshi, K., Mukhopadhyay, S., Goel, N., Nanware, N., Mahapatra, S. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 61(2):408-415 Feb, 2014 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2013.2295844 |