Self-aligned contacts for 10nm FDSOI Node: From device to circuit evaluation

التفاصيل البيبلوغرافية
العنوان: Self-aligned contacts for 10nm FDSOI Node: From device to circuit evaluation
المؤلفون: Niebojewski, H., Le Royer, C., Morand, Y., Rozeau, O., Jaud, M.-A., Barnola, S., Arvet, C., Pradelles, J., Bustos, J., Pedini, J.M., Dubois, E., Faynot, O.
المصدر: 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2013 IEEE. :1-2 Oct, 2013
Relation: 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (Formerly known as SOI Conference)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781479913619
تدمد:1078621X
DOI:10.1109/S3S.2013.6716549