مؤتمر
Analysis of electro-thermal-stress failure of the LDMOS FET under HPM pulses
| العنوان: | Analysis of electro-thermal-stress failure of the LDMOS FET under HPM pulses |
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| المؤلفون: | Zhou, Wei-feng, Zhou, Liang, Mao, Jun-Fa, Peng, Hong-li, Yin, Wen-Yan |
| المصدر: | 2013 IEEE Electrical Design of Advanced Packaging Systems Symposium (EDAPS) Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2013 IEEE. :205-208 Dec, 2013 |
| Relation: | 2013 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479923137 9781479923113 |
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| تدمد: | 21511225 21511233 |
| DOI: | 10.1109/EDAPS.2013.6724425 |