دورية أكاديمية
Profiling of Channel-Hot-Carrier Stress-Induced Trap Distributions Along Channel and Gate Dielectric in High-$k$ Gated MOSFETs by a Modified Charge Pumping Technique
العنوان: | Profiling of Channel-Hot-Carrier Stress-Induced Trap Distributions Along Channel and Gate Dielectric in High-$k$ Gated MOSFETs by a Modified Charge Pumping Technique |
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المؤلفون: | Lu, C.-C., Chang-Liao, K.-S., Tsao, C.-H., Wang, T.-K., Ko, H.-C., Hsu, Y.-T. |
المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 61(4):936-942 Apr, 2014 |
قاعدة البيانات: | IEEE Xplore Digital Library |
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