دورية أكاديمية
Fast simultaneous thickness measurements of gold and nickel layers on copper substrates
| العنوان: | Fast simultaneous thickness measurements of gold and nickel layers on copper substrates |
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| المؤلفون: | Maloonado, J. R., Maydan, D. |
| المصدر: | The Bell System Technical Journal Bell Syst. Tech. J. Bell System Technical Journal, The. 58(8):1851-1868 Oct, 1979 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00058580 |
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| DOI: | 10.1002/j.1538-7305.1979.tb02977.x |