مؤتمر
Quality assurance in memory built-in self-test tools
| العنوان: | Quality assurance in memory built-in self-test tools |
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| المؤلفون: | Au, Albert, Pogiel, Artur, Rajski, Janusz, Sydow, Piotr, Tyszer, Jerzy, Zawada, Justyna |
| المصدر: | 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on. :39-44 Apr, 2014 |
| Relation: | 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479945603 9781479945580 |
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| DOI: | 10.1109/DDECS.2014.6868760 |