دورية أكاديمية
Substrate-Induced Noise Model and Parameter Extraction for High-Frequency Noise Modeling of Sub-Micron MOSFETs
العنوان: | Substrate-Induced Noise Model and Parameter Extraction for High-Frequency Noise Modeling of Sub-Micron MOSFETs |
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المؤلفون: | Ong, S. N., Yeo, K. S., Chew, K. W. J., Chan, L. H. K. |
المصدر: | IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 62(9):1973-1985 Sep, 2014 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 00189480 15579670 |
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DOI: | 10.1109/TMTT.2014.2340375 |