مؤتمر
From an analytic NBTI device model to reliability assessment of complex digital circuits
| العنوان: | From an analytic NBTI device model to reliability assessment of complex digital circuits |
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| المؤلفون: | Aryan, N. Pour, Listl, A., Heiss, L., Yilmaz, C., Georgakos, G., Schmitt-Landsiedel, D. |
| المصدر: | 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International. :19-24 Jul, 2014 |
| Relation: | 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479953240 |
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| تدمد: | 19429398 19429401 |
| DOI: | 10.1109/IOLTS.2014.6873666 |