التفاصيل البيبلوغرافية
| العنوان: |
Effects of the field dependent occupation of electrical-stress-generated traps on the conduction and breakdown of thin SiO/sub 2/ films |
| المؤلفون: |
Barniol, N., Sune, J., Farres, E., Placencia, I., Aymerich, X. |
| المصدر: |
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Conduction and Breakdown in Solid Dielectrics, 1989., Proceedings of the 3rd International Conference on. :168-172 1989 |
| Relation: |
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
