مؤتمر
Effects of the field dependent occupation of electrical-stress-generated traps on the conduction and breakdown of thin SiO/sub 2/ films
العنوان: | Effects of the field dependent occupation of electrical-stress-generated traps on the conduction and breakdown of thin SiO/sub 2/ films |
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المؤلفون: | Barniol, N., Sune, J., Farres, E., Placencia, I., Aymerich, X. |
المصدر: | Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Conduction and Breakdown in Solid Dielectrics, 1989., Proceedings of the 3rd International Conference on. :168-172 1989 |
Relation: | Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics |
قاعدة البيانات: | IEEE Xplore Digital Library |
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