مؤتمر
Impact of etch stop layer on negative bias illumination stress of amorphous Indium Gallium Zinc Oxide transistors
| العنوان: | Impact of etch stop layer on negative bias illumination stress of amorphous Indium Gallium Zinc Oxide transistors |
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| المؤلفون: | Bhoolokam, Ajay, Nag, Manoj, Chasin, Adrian, Steudel, Soeren, Genoe, Jan, Gelinck, Gerwin, Groeseneken, Guido, Heremans, Paul |
| المصدر: | 2014 44th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2014 44th European. :302-304 Sep, 2014 |
| Relation: | ESSDERC 2014 - 44th European Solid State Device Research Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479943784 9781479943760 |
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| تدمد: | 19308876 23786558 |
| DOI: | 10.1109/ESSDERC.2014.6948820 |