مؤتمر
Advanced TCAD for predictive FinFETs Vth mismatch using full 3D process/device simulation
| العنوان: | Advanced TCAD for predictive FinFETs Vth mismatch using full 3D process/device simulation |
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| المؤلفون: | Bazizi, E. M, Zaka, A., Herrmann, T., Benistant, F., Tin, J. H. M., Goh, J. P., Jiang, L., Joshi, M., van Meer, H., Korablev, K. |
| المصدر: | 2014 44th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2014 44th European. :341-344 Sep, 2014 |
| Relation: | ESSDERC 2014 - 44th European Solid State Device Research Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479943784 9781479943760 |
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| تدمد: | 19308876 23786558 |
| DOI: | 10.1109/ESSDERC.2014.6948830 |