Reliability estimation at block-level granularity of spin-transfer-torque MRAMs

التفاصيل البيبلوغرافية
العنوان: Reliability estimation at block-level granularity of spin-transfer-torque MRAMs
المؤلفون: Di Carlo, S., Indaco, M., Prinetto, P., Vatajelu, Elena I., Rodriguez-Montanes, R., Figueras, J.
المصدر: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on. :75-80 Oct, 2014
Relation: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781479961542
9781479961559
تدمد:15505774
23777966
DOI:10.1109/DFT.2014.6962093