مؤتمر
The effect of metal noise factor to RFID location system
العنوان: | The effect of metal noise factor to RFID location system |
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المؤلفون: | Wong, S. F., Zheng, Y. |
المصدر: | 2013 IEEE International Conference on Industrial Engineering and Engineering Management Industrial Engineering and Engineering Management (IEEM), 2013 IEEE International Conference on. :310-314 Dec, 2013 |
Relation: | 2013 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781479909865 |
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تدمد: | 21573611 2157362X |
DOI: | 10.1109/IEEM.2013.6962424 |