دورية أكاديمية
Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon
العنوان: | Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon |
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المؤلفون: | Ghoneim, M. T., Rojas, J. P., Young, C. D., Bersuker, G., Hussain, M. M. |
المصدر: | IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 64(2):579-585 Jun, 2015 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 00189529 15581721 |
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DOI: | 10.1109/TR.2014.2371054 |