Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon

التفاصيل البيبلوغرافية
العنوان:	Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon
المؤلفون:	Ghoneim, M. T., Rojas, J. P., Young, C. D., Bersuker, G., Hussain, M. M.
المصدر:	IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 64(2):579-585 Jun, 2015
قاعدة البيانات:	IEEE Xplore Digital Library

الوصف
تدمد:	00189529 15581721
DOI:	10.1109/TR.2014.2371054