مؤتمر
Charging effects on SOI based NEMS by the example of a nanoscale Thermal-Time-of-Flight (TToF) sensor
| العنوان: | Charging effects on SOI based NEMS by the example of a nanoscale Thermal-Time-of-Flight (TToF) sensor |
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| المؤلفون: | Ebschke, S., Wieker, M., Gerwinn, J., Loechte, A., Kallis, K. T., Fiedler, H. L. |
| المصدر: | 14th IEEE International Conference on Nanotechnology Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on. :785-788 Aug, 2014 |
| Relation: | 2014 IEEE 14th International Conference on Nanotechnology (IEEE-NANO) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479956227 |
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| تدمد: | 19449399 |
| DOI: | 10.1109/NANO.2014.6968033 |