مؤتمر
Charging effects on SOI based NEMS by the example of a nanoscale Thermal-Time-of-Flight (TToF) sensor
العنوان: | Charging effects on SOI based NEMS by the example of a nanoscale Thermal-Time-of-Flight (TToF) sensor |
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المؤلفون: | Ebschke, S., Wieker, M., Gerwinn, J., Loechte, A., Kallis, K. T., Fiedler, H. L. |
المصدر: | 14th IEEE International Conference on Nanotechnology Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on. :785-788 Aug, 2014 |
Relation: | 2014 IEEE 14th International Conference on Nanotechnology (IEEE-NANO) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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