Comparative Study of Nanoscale FinFET Structures for High-K Gate Dielectrics

التفاصيل البيبلوغرافية
العنوان: Comparative Study of Nanoscale FinFET Structures for High-K Gate Dielectrics
المؤلفون: Parihar, Richa, Narendar, Vadthiya, Mishra, R.A.
المصدر: 2014 International Conference on Devices, Circuits and Communications (ICDCCom) Devices, Circuits and Communications (ICDCCom), 2014 International Conference on. :1-5 Sep, 2014
Relation: 2014 International Conference on Devices, Circuits and Communications (ICDCCom)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781479960521
DOI:10.1109/ICDCCom.2014.7024708