Future challenges and opportunities for heterogeneous process technology. Towards the thin films, Zero Intrinsic Variability devices, Zero Power era

التفاصيل البيبلوغرافية
العنوان:	Future challenges and opportunities for heterogeneous process technology. Towards the thin films, Zero Intrinsic Variability devices, Zero Power era
المؤلفون:	Deleonibus, S., Faynot, O., Ernst, T., Vinet, M., Batude, P., Andrieu, F., Weber, O., Cooper, D., Bertin, F., Moriceau, H., DiCioccio, L., Signamarcheix, T., Sanquer, M., Jehl, X., Cueto, O., Fanet, H., Martin, F., Okuno, H., Nemouchi, F., Poupon, G., Lamy, Y., Gasparutto, D., Baillin, X., Duraffourg, L., Arcamone, J., Perniola, L., de Salvo, B., Vianello, E., Hutin, L., Poulain, C., Beigne, E., Tiron, R., Pain, L., Tedesco, S., Barnola, S., Posseme, N., Le Royer, C., Villalon, A., Salot, R.
المصدر:	2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :9.2.1-9.2.4 Dec, 2014
Relation:	2014 IEEE International Electron Devices Meeting (IEDM)
قاعدة البيانات:	IEEE Xplore Digital Library