مؤتمر
New insights into the design for end-of-life variability of NBTI in scaled high-κ/metal-gate Technology for the nano-reliability era
| العنوان: | New insights into the design for end-of-life variability of NBTI in scaled high-κ/metal-gate Technology for the nano-reliability era |
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| المؤلفون: | Pengpeng Ren, Wang, Runsheng, Ji, Zhigang, Peng Hao, Xiaobo Jiang, Shaofeng Guo, Mulong Luo, Duan, Meng, Zhang, Jian F., Jianping Wang, Jinhua Liu, Weihai Bu, Jingang Wu, Waisum Wong, Shaofeng Yu, Hanming Wu, Shiuh-Wuu Lee, Nuo Xu, Ru Huang |
| المصدر: | 2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :34.1.1-34.1.4 Dec, 2014 |
| Relation: | 2014 IEEE International Electron Devices Meeting (IEDM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479980017 |
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| تدمد: | 01631918 2156017X |
| DOI: | 10.1109/IEDM.2014.7047165 |