Evaluation of variability and RTN in scaled RRAM

التفاصيل البيبلوغرافية
العنوان: Evaluation of variability and RTN in scaled RRAM
المؤلفون: Veksler, Dmitry, Bersuker, G., Butcher, B., Gilmer, D., Matthews, K., Deora, S.
المصدر: 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International. :52-52 Oct, 2014
Relation: 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781479973088
9781479972869
9781479972746
تدمد:19308841
23748036
DOI:10.1109/IIRW.2014.7049509