مؤتمر
Evaluation of variability and RTN in scaled RRAM
العنوان: | Evaluation of variability and RTN in scaled RRAM |
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المؤلفون: | Veksler, Dmitry, Bersuker, G., Butcher, B., Gilmer, D., Matthews, K., Deora, S. |
المصدر: | 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International. :52-52 Oct, 2014 |
Relation: | 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781479973088 9781479972869 9781479972746 |
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تدمد: | 19308841 23748036 |
DOI: | 10.1109/IIRW.2014.7049509 |