مؤتمر
A novel on-chip self-testing signature register for low cost manufacturing test
العنوان: | A novel on-chip self-testing signature register for low cost manufacturing test |
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المؤلفون: | Lodha, Kalpesh R., Kumar, Sudeendra, Mahapatra, K. K. |
المصدر: | 2015 International Conference on VLSI Systems, Architecture, Technology and Applications (VLSI-SATA) VLSI Systems, Architecture, Technology and Applications (VLSI-SATA), 2015 International Conference on. :1-6 Jan, 2015 |
Relation: | 2015 International Conference on VLSI Systems, Architecture, Technology and Applications (VLSI-SATA) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781479979257 9781479979264 |
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DOI: | 10.1109/VLSI-SATA.2015.7050454 |