التفاصيل البيبلوغرافية
| العنوان: |
Analog IC test and product engineering curriculum for M |
| المؤلفون: |
Kamsani, N. A., Sidek, R. M., Yeo, C. W., Gan, D., Quek, C.T., Krishnasamy, S., Lee, Y. M., Bolanos, M. A. |
| المصدر: |
2014 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE) Teaching, Assessment and Learning (TALE), 2014 International Conference on. :283-287 Dec, 2014 |
| Relation: |
2014 International Conference of Teaching, Assessment and Learning (TALE) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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