مؤتمر
Compact modeling solution of layout dependent effect for FinFET technology
| العنوان: | Compact modeling solution of layout dependent effect for FinFET technology |
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| المؤلفون: | Chen, D.C., Lin, G.S., Lee, T.H., Lee, R., Liu, Y.C., Wang, M.F., Cheng, Y.C., Wu, D.Y. |
| المصدر: | Proceedings of the 2015 International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2015 International Conference on. :110-115 Mar, 2015 |
| Relation: | 2015 International Conference on Microelectronic Test Structures (ICMTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479983025 9781479983049 |
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| تدمد: | 10719032 21581029 |
| DOI: | 10.1109/ICMTS.2015.7106119 |