مؤتمر
Supply voltage dependence of single event upset sensitivity in diverse SRAM devices
العنوان: | Supply voltage dependence of single event upset sensitivity in diverse SRAM devices |
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المؤلفون: | Zhang, Zhangang, Liu, Jie, Sun, Youmei, Hou, Mingdong, Tong, Teng, Gu, Song, Liu, Tianqi, Geng, Chao, Xi, Kai, Yao, Huijun, Luo, Jie, Duan, Jinglai, Mo, Dan, Su, Hong, Lei, Zhifeng, En, Yunfei, Huang, Yun |
المصدر: | 2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) Reliability, Maintainability and Safety (ICRMS), 2014 International Conference on. :114-119 Aug, 2014 |
Relation: | 2014 International Conference on Reliability, Maintainability and Safety (ICRMS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781479966318 9781479966325 |
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DOI: | 10.1109/ICRMS.2014.7107149 |