Supply voltage dependence of single event upset sensitivity in diverse SRAM devices

التفاصيل البيبلوغرافية
العنوان: Supply voltage dependence of single event upset sensitivity in diverse SRAM devices
المؤلفون: Zhang, Zhangang, Liu, Jie, Sun, Youmei, Hou, Mingdong, Tong, Teng, Gu, Song, Liu, Tianqi, Geng, Chao, Xi, Kai, Yao, Huijun, Luo, Jie, Duan, Jinglai, Mo, Dan, Su, Hong, Lei, Zhifeng, En, Yunfei, Huang, Yun
المصدر: 2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) Reliability, Maintainability and Safety (ICRMS), 2014 International Conference on. :114-119 Aug, 2014
Relation: 2014 International Conference on Reliability, Maintainability and Safety (ICRMS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781479966318
9781479966325
DOI:10.1109/ICRMS.2014.7107149