مؤتمر
A method for rapid screening of various low-k TDDB models
| العنوان: | A method for rapid screening of various low-k TDDB models |
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| المؤلفون: | Chen, Fen, Graas, Carole, Shinosky, Michael, Burke, Chad, Feng, Kai D, Bocash, Craig, Muralidhar, Ramachandran |
| المصدر: | 2015 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2015 IEEE International. :3A.1.1-3A.1.11 Apr, 2015 |
| Relation: | 2015 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467373623 |
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| تدمد: | 15417026 19381891 |
| DOI: | 10.1109/IRPS.2015.7112697 |