Influence of epitaxy and gate deposition process on Ron resistance of AlGaN/GaN-on-Si HEMT

التفاصيل البيبلوغرافية
العنوان: Influence of epitaxy and gate deposition process on Ron resistance of AlGaN/GaN-on-Si HEMT
المؤلفون: Lehmann, J., Leroux, C., Charles, M., Torres, A., Morvan, E., Reimbold, G., Bano, E., Ghibaudo, G.
المصدر: 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on. :261-264 May, 2015
Relation: 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781479962594
9781479962617
تدمد:10636854
19460201
DOI:10.1109/ISPSD.2015.7123439