مؤتمر
Low-noise bias reliability of AlInAs/GaInAs MODFETs with linearly graded low-temperature buffer layers grown on GaAs substrates
| العنوان: | Low-noise bias reliability of AlInAs/GaInAs MODFETs with linearly graded low-temperature buffer layers grown on GaAs substrates |
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| المؤلفون: | Wakita, A.S., Rohdin, H., Robbins, V.M., Moll, N., Su, C.-Y., Nagy, A., Basile, D.P. |
| المصدر: | Conference Proceedings. 1998 International Conference on Indium Phosphide and Related Materials (Cat. No.98CH36129) Indium phosphide and related materials Indium Phosphide and Related Materials, 1998 International Conference on. :223-226 1998 |
| Relation: | Conference Proceedings. 1998 International Conference on Indium Phosphide and Related Materials |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780342208 9780780342200 |
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| تدمد: | 10928669 |
| DOI: | 10.1109/ICIPRM.1998.712442 |