مؤتمر
Advantages of digital convergence for functional test
| العنوان: | Advantages of digital convergence for functional test |
|---|---|
| المؤلفون: | Hutchinson, J.A. |
| المصدر: | 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) AUTOTESTCON 98 AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE. :368-376 1998 |
| Relation: | 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780344200 9780780344204 |
|---|---|
| تدمد: | 10887725 |
| DOI: | 10.1109/AUTEST.1998.713470 |