مؤتمر
Advantages of digital convergence for functional test
العنوان: | Advantages of digital convergence for functional test |
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المؤلفون: | Hutchinson, J.A. |
المصدر: | 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) AUTOTESTCON 98 AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE. :368-376 1998 |
Relation: | 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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