مؤتمر
Analyzing uncertainty matrices associated with multiple S-parameter measurements
| العنوان: | Analyzing uncertainty matrices associated with multiple S-parameter measurements |
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| المؤلفون: | Ridler, Nick M., Salter, Martin J. |
| المصدر: | 2015 85th Microwave Measurement Conference (ARFTG) Microwave Measurement Conference (ARFTG), 2015 85th. :1-6 May, 2015 |
| Relation: | 2015 85th ARFTG Microwave Measurement Conference (ARFTG) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479988877 |
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| DOI: | 10.1109/ARFTG.2015.7162898 |