مؤتمر
VERMEER: A Tool for Tracing and Explaining Faulty C Programs
| العنوان: | VERMEER: A Tool for Tracing and Explaining Faulty C Programs |
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| المؤلفون: | Schwartz-Narbonne, Daniel, Oh, Chanseok, Schaf, Martin, Wies, Thomas |
| المصدر: | 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering Software Engineering (ICSE), 2015 IEEE/ACM 37th IEEE International Conference on. 2:737-740 May, 2015 |
| Relation: | 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering (ICSE) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479919345 |
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| تدمد: | 02705257 15581225 |
| DOI: | 10.1109/ICSE.2015.236 |