Enhanced signatures for event classification: the projector approach

التفاصيل البيبلوغرافية
العنوان: Enhanced signatures for event classification: the projector approach
المؤلفون: Venkatachalam, V., Aravena, J.L.
المصدر: Proceedings of the IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis (Cat. No.98TH8380) Time-frequency and time-scale analysis Time-Frequency and Time-Scale Analysis, 1998. Proceedings of the IEEE-SP International Symposium on. :493-496 1998
Relation: Proceedings of International Symposium on Time-Frequency and Time-Scale Analysis
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780350731
9780780350731
DOI:10.1109/TFSA.1998.721469