مؤتمر
Enhanced signatures for event classification: the projector approach
العنوان: | Enhanced signatures for event classification: the projector approach |
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المؤلفون: | Venkatachalam, V., Aravena, J.L. |
المصدر: | Proceedings of the IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis (Cat. No.98TH8380) Time-frequency and time-scale analysis Time-Frequency and Time-Scale Analysis, 1998. Proceedings of the IEEE-SP International Symposium on. :493-496 1998 |
Relation: | Proceedings of International Symposium on Time-Frequency and Time-Scale Analysis |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780350731 9780780350731 |
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DOI: | 10.1109/TFSA.1998.721469 |